Temperature dependent study of the band edge excitons of ReS2 and ReSe2

被引:13
|
作者
Huang, YS [1 ]
Ho, CH
Liao, PC
Tiong, KK
机构
[1] Natl Taiwan Inst Technol, Dept Elect Engn, Taipei 106, Taiwan
[2] Natl Taiwan Ocean Univ, Dept Elect Engn, Keelung 202, Taiwan
关键词
transition-metal dichalcogenides; exciton; piezoreflectance;
D O I
10.1016/S0925-8388(97)00335-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
ReS2 and ReSe2 are diamagnetic indirect semiconductors and belong to the family of transition-metal dichalcogenides crystallizing in the distorted octahedral layer structure of triclinic symmetry. We have measured the temperature dependence of the spectral features in the vicinity of the direct gaps E-g(d) in the temperature range between 25 and 525 K using piezoreflectance (PzR). The polarization dependence of the PzR spectra provides conclusive evidence that the features are associated with the interband excitonic transitions from different origins. From a detailed lineshape fit to the PzR spectra, we have been able to determine accurately the temperature dependence of the energies and broadening parameters of the band-edge excitons. The parameters that describe the temperature variation of the transition energies and broadening function have been evaluated and discussed. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:92 / 96
页数:5
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