Disturbing interference patterns in femtosecond stimulated Raman microscopy

被引：14
|
作者：
Ploetz, E. [1 ,2 ]
Marx, B. [1 ,2 ]
Gilch, P. [1 ,2 ,3 ]
机构：
[1] Univ Munich, Fak Phys, Lehrstuhl BioMol Opt, D-80538 Munich, Germany
[2] Univ Munich, Fak Phys, CIPSM, D-80538 Munich, Germany
[3] Univ Dusseldorf, Inst Phys Chem, D-40225 Dusseldorf, Germany
来源：
JOURNAL OF RAMAN SPECTROSCOPY | 2010年 / 41卷 / 06期
关键词：
Raman microscopy; stimulated Raman scattering; femtosecond laser pulse; spectral modulations; white-light generation; HIGH-SENSITIVITY; INTERFEROMETRY;
D O I：
10.1002/jrs.2488
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Femtosecond stimulated Raman microscopy (FSRM) is an upcoming technique in nonlinear microscopy which facilitates rapid chemical mapping. It employs femtosecond white-light pulses as probe pulses and intense picosecond pulses as pump pulses. Stimulated Raman scattering (SRS) occurs at the focus of a scanning microscope. Chemical constituents in the sample are identified via their Raman signatures. In this article, disturbing interference patterns in FSRM are reported. They are caused by a broadening of the pump pulse due to nonlinear interactions in the focal region of the microscope and reduce the signal-to-noise ratio. The properties of these modulations are explored, and the methods to suppress them are presented. Copyright (C) 2009 John Wiley & Sons, Ltd.
引用
收藏
页码：609 / 613
页数：5
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