Thin-film fine-pattern technology for LTCC multilayer substrates

被引:0
|
作者
Anderson, Brian
Horio, Shuichi
Kobayashi, Kyoji
Tamada, Nobuhiko
机构
关键词
D O I
10.1109/ECTC.2007.373777
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The ability to create fine-pattern line widths on LTCC technology substrates, which can be used for high-temperature and high-frequency applications, has been restricted by the limitations of the existing thick-film technology to a practical level of approximately 60 mu m line widths; other technologies for finer line widths and spacings are, as yet, experimental in nature. In this study, the use of a thin-film process, which is already used in the mass production of electronic components, is evaluated for use as a fine surface-layer pattern in line widths as small as 15 mu m. Such a technology is possible and appropriate when due attention is paid to the chemistry of the process, the use of low-halogen insulation materials, the use of uniform processes, and appropriate washing methods.
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页码:59 / 64
页数:6
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