Comparison of excited nitrogen sources for molecular-beam-epitaxy GaN growth: Radio frequency and electron cyclotron resonance plasma sources

被引:19
|
作者
Cho, SH
Okumura, H
Akimoto, K
机构
[1] Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan
[2] Univ Tsukuba, Inst Sci Mat, Tsukuba, Ibaraki 3058573, Japan
关键词
D O I
10.1063/1.126802
中图分类号
O59 [应用物理学];
学科分类号
摘要
A comparative study of electron cyclotron resonance (ECR) and radio frequency (rf) plasma as a nitrogen source for molecular-beam epitaxy GaN was carried out. The effects of differences in the excited nitrogen species on the optical signals during GaN growth were investigated by 77 K photoluminescence (PL). For epitaxial layers grown at optimum V/III ratio using ECR and rf plasma, the PL spectra were dominated by near band-edge emission at 3.47 eV. However, when the V/III ratio was less than the optimum V/III ratio, a broad emission band at about 3.2-3.3 eV was observed in the PL spectrum for the GaN epilayer grown using rf plasma, while in the case of growth using ECR plasma, a deep level emission at about 2.2 eV appeared. These characteristics in PL spectra can used to identify differences in the chemical species in the nitrogen plasma. (C) 2000 American Institute of Physics. [S0003-6951(00)03926-7].
引用
收藏
页码:3861 / 3863
页数:3
相关论文
共 50 条
  • [1] Comparison of excited nitrogen sources for molecular-beam-epitaxy GaN growth: Radio frequency and electron cyclotron resonance plasma sources
    Cho, Sung-Hwan
    Okumura, Hajime
    Akimoto, Katsuhiro
    2000, American Inst of Physics, Woodbury, NY, USA (76)
  • [2] Nitrogen species from radio frequency plasma sources used for molecular beam epitaxy growth of GaN
    Blant, AV
    Hughes, OH
    Cheng, TS
    Novikov, SV
    Foxon, CT
    PLASMA SOURCES SCIENCE & TECHNOLOGY, 2000, 9 (01): : 12 - 17
  • [3] Theoretical study of GaN molecular beam epitaxy growth using electron cyclotron resonance nitrogen plasma
    Fu, WB
    Venkat, R
    Meyyappan, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (05): : 1803 - 1807
  • [4] SI SURFACE CLEANING AND EPITAXIAL-GROWTH OF GAAS ON SI BY ELECTRON-CYCLOTRON RESONANCE PLASMA-EXCITED MOLECULAR-BEAM-EPITAXY AT LOW-TEMPERATURES
    SHIBATA, T
    KONDO, N
    NANISHI, Y
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (11) : 3459 - 3462
  • [5] Radio-frequency plasma-excited molecular beam epitaxy growth of GaN on graphene/Si(100) substrates
    Araki, Tsutomu
    Uchimura, Satoru
    Sakaguchi, Junichi
    Nanishi, Yasushi
    Fujishima, Tatsuya
    Hsu, Allen
    Kim, Ki Kang
    Palacios, Tomas
    Pesquera, Amaia
    Centeno, Alba
    Zurutuza, Amaia
    APPLIED PHYSICS EXPRESS, 2014, 7 (07)
  • [6] Variation of Growth Rate in InN Molecular-Beam-Epitaxy Growth Using Multiple Radio-Frequency Plasma Cells
    Sato, Yuichi
    Funaki, Kosuke
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2013, 52 (08)
  • [7] Radio-frequency molecular-beam-epitaxy growth of III nitrides for microsensor applications
    Starikov, D
    Boney, C
    Berishev, I
    Hernandez, IC
    Bensaoula, A
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (04): : 1404 - 1408
  • [8] Crystal growth and optical property of GaN on silica glass by electron-cyclotron-resonance plasma-excited molecular beam epitaxy (ECR-MBE)
    Murata, N
    Tochishita, W
    Shimizu, Y
    Araki, T
    Nanishi, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1998, 37 (10B): : L1214 - L1216
  • [9] MOLECULAR-BEAM-EPITAXY GROWTH OF GAN ON GAAS(100) BY USING REACTIVE NITROGEN-SOURCE
    HE, ZQ
    DING, XM
    HOU, XY
    WANG, X
    APPLIED PHYSICS LETTERS, 1994, 64 (03) : 315 - 317
  • [10] Characterization of electronic states in molecular beam epitaxy grown GaN by optical admittance spectroscopy: Comparison of different nitrogen plasma sources
    Krtschil, A
    Witte, H
    Lisker, M
    Christen, J
    Birkle, U
    Einfeldt, S
    Hommel, D
    APPLIED PHYSICS LETTERS, 1999, 74 (14) : 2032 - 2034