Recombination losses in STJ X-ray detectors with killed electrode

被引：2

作者：

Andrianov, V. A. ^{[1
]}

Filippenko, L. V. ^{[2
]}

Gorkov, V. P. ^{[3
]}

Koshelets, V. P. ^{[2
]}

机构：

[1] Moscow MV Lomonosov State Univ, Inst Nucl Phys, Moscow 119992, Russia

[2] Inst Radio Engn & Elect, Moscow 103907, Russia

[3] Moscow MV Lomonosov State Univ, Fac Computat Math & Cybernet, Moscow 119992, Russia

来源：

7TH EUROPEAN CONFERENCE ON APPLIED SUPERCONDUCTIVITY (EUCAS'05) | 2006年 / 43卷

关键词：

D O I：

10.1088/1742-6596/43/1/320

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Superconducting tunnel junction X-rays detectors Ti/Nb/Al/AlOx/Al/Nb/NbN with the Ti/Nb/Al/killed electrode were studied under irradiation by X-rays photons of different energies produced by the fluorescence method. The nonlinearity of the detector response and the shape of the detector line were analyzed on the basis of the diffusion model taking into account the quasiparticle self-recombination and edge losses.

引用

页码：1311 / 1314

页数：4

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