Measurement of ablation threshold of oxide-film-coated aluminium nanoparticles irradiated by femtosecond laser pulses

被引：3

作者：

Chefonov, O. V. ^{[1
]}

Ovchinnikov, A. V. ^{[1
]}

Il'ina, I. V. ^{[1
]}

Agranat, M. B. ^{[1
]}

机构：

[1] Russian Acad Sci, Joint Inst High Temp, Ul Izhorskaya 13,Bld 2, Moscow 125412, Russia

来源：

QUANTUM ELECTRONICS | 2016年 / 46卷 / 03期

基金：

俄罗斯科学基金会;

关键词：

femtosecond laser pulse; luminescence; nanoparticles; ULTRAVIOLET; FABRICATION; AL;

D O I：

10.1070/QEL15970

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report the results of experiments on estimation of femtosecond laser threshold intensity at which nanoparticles are removed from the substrate surface. The studies are performed with nanoparticles obtained by femtosecond laser ablation of pure aluminium in distilled water. The attenuation (or extinction, i.e. absorption and scattering) spectra of nanoparticles are measured at room temperature in the UV and optical wavelength ranges. The size of nanoparticles is determined using atomic force microscopy. A new method of scanning photoluminescence is proposed to evaluate the threshold of nanoparticle removal from the surface of a glass substrate exposed to IR femtosecond laser pulses with intensities 10(11) - 10(13) W cm(-2).

引用

页码：223 / 228

页数：6

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