The LERIX user facility

被引：0
|
作者：
Seidler, G. T. [1 ]
Fister, T. T. [1 ]
Cross, J. O. [2 ]
Nagle, K. P. [1 ]
机构：
[1] Univ Washington, Seattle, WA 98105 USA
[2] Argonne Natl Lab, Argonne, IL 60439 USA
来源：
X-RAY ABSORPTION FINE STRUCTURE-XAFS13 | 2007年 / 882卷
关键词：
nonresonant x-ray Raman scattering; x-ray absorption fine structure; x-ray spectrometer;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We describe the lower energy resolution inelastic x-ray scattering (LERIX) spectrometer, located at sector 20 PNC-XOR of the Advanced Photon Source. This instrument, which is now available to general users, is the first user facility optimized for high throughput measurements of momentum transfer dependent nonresonant inelastic x-ray scattering (NRIXS) from the core shell electrons of relatively light elements or the less-tightly bound electrons of heavier elements. By means of example, we present new NRIXS measurements of the near-edge structure for the Ledges of Al and the K-edge in Si.
引用
收藏
页码：911 / +
页数：2
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