About the Possibility of Mistakes When Using Unipolar Electric Field Pulses When Assessing Electronic Device Immunity to UWB Pulses

被引：0

作者：

Parfenov, Yury V. ^{[1
]}

Chepelev, Vladimir M. ^{[1
]}

Radasky, William A. ^{[2
]}

机构：

[1] Russian Acad Sci, Joint Inst High Temp, Izhorskaya 13,Bld 2, Moscow 125412, Russia

[2] Metatech Corp, 358 S Fairview Ave,Suite E, Goleta, CA 93117 USA

来源：

2018 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 2018 IEEE ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC/APEMC) | 2018年

关键词：

UWB pulse; immunity; electronic device;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An analysis of the undesirable consequences of using unipolar waveforms of UWB electric field pulses for the assessment of the immunity of electronic devices is presented

引用

页码：928 / 931

页数：4