Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs

被引：2
|
作者：
Sutyrin, Denis V. [1 ]
Poli, Nicola
Beverini, Nicolo [2 ]
Tino, Guglielmo M.
机构：
[1] Univ Florence, Dipartimento Fis & Astron, I-50019 Sesto Fiorentino, Firenze, Italy
[2] Univ Pisa, Dipartimento Fis, I-56127 Pisa, Italy
来源：
OPTICAL ENGINEERING | 2014年 / 53卷 / 12期
关键词：
optical frequency comb; pumping; carrier-envelope offset frequency; TI-SAPPHIRE LASERS; PHASE DYNAMICS; GENERATION;
D O I：
10.1117/1.OE.53.12.122603
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We experimentally study two Ti:sapphire optical frequency comb femtosecond regimes, respectively, with a linear and a nonlinear dependence of the carrier-envelope offset frequency (f(CEO)) on pump intensity. For both regimes, we study the effect of single- and multimode pump lasers on the fCEO phase noise. We demonstrate that the femtosecond regime is playing a more important role on the f(CEO) phase noise and stability than the pump laser type. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
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页数：5
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