Self-testing in parallel

被引:32
|
作者
McKague, Matthew [1 ,2 ]
机构
[1] Univ Otago, Dept Comp Sci, Hamilton, New Zealand
[2] Dodd Walls Ctr Photon & Quantum Technol, Hamilton, New Zealand
来源
NEW JOURNAL OF PHYSICS | 2016年 / 18卷
关键词
self-testing; device independence; non-local games;
D O I
10.1088/1367-2630/18/4/045013
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Self-testing allows us to determine, through classical interaction only, whether some players in a non-local game share particular quantum states. Most work on self-testing has concentrated on developing tests for small states like one pair of maximally entangled qubits, or on tests where there is a separate player for each qubit, as in a graph state. Here we consider the case of testing many maximally entangled pairs of qubits shared between two players. Previously such a test was shown where testing is sequential, i.e., one pair is tested at a time. Here we consider the parallel case where all pairs are tested simultaneously, giving considerably more power to dishonest players. We derive sufficient conditions for a self-test for many maximally entangled pairs of qubits shared between two players and also two constructions for self-tests where all pairs are tested simultaneously.
引用
收藏
页数:16
相关论文
共 50 条
  • [1] Self-testing in parallel with CHSH
    McKague, Matthew
    QUANTUM, 2017, 1
  • [2] PARALLEL-SEQUENTIAL VLSI SELF-TESTING BY DECOMPOSITION
    AKSENOVA, GP
    KHALCHEV, VF
    AUTOMATION AND REMOTE CONTROL, 1991, 52 (04) : 560 - 566
  • [3] Parallel Self-Testing of the GHZ State with a Proof by Diagrams
    Breiner, Spencer
    Kalev, Amir
    Miller, Carl A.
    ELECTRONIC PROCEEDINGS IN THEORETICAL COMPUTER SCIENCE, 2019, (287): : 43 - 66
  • [4] Promoting STI self-testing through HIV self-testing
    Wang, Dongya
    Tan, Rayner
    Marley, Gifty
    Tucker, Joseph D.
    Tang, Weiming
    JOURNAL OF THE INTERNATIONAL AIDS SOCIETY, 2023, 26 (06)
  • [5] Optimization of parallel-series self-testing for discrete devices
    Aksenova, GP
    AUTOMATION AND REMOTE CONTROL, 2004, 65 (08) : 1312 - 1327
  • [6] Optimization of Parallel-Series Self-Testing for Discrete Devices
    G. P. Aksenova
    Automation and Remote Control, 2004, 65 : 1312 - 1327
  • [7] Optimization of parallel-series self-testing for discrete devices
    Aksenova, G.P.
    Avtomatika i Telemekhanika, 2004, (08): : 156 - 173
  • [8] Device-independent parallel self-testing of two singlets
    Wu, Xingyao
    Bancal, Jean-Daniel
    McKague, Matthew
    Scarani, Valerio
    PHYSICAL REVIEW A, 2016, 93 (06)
  • [9] SELF-TESTING COMPUTERS
    CLARY, JB
    SACANE, RA
    COMPUTER, 1979, 12 (10) : 49 - &
  • [10] A SELF-TESTING PLA
    GRASSL, G
    PFLEIDERER, HJ
    ISSCC DIGEST OF TECHNICAL PAPERS, 1982, 25 : 60 - 61