Frequency domain filtering for enhanced SAM inspection of microelectronic components

被引：0
|
作者：
McKeon, JCP [1 ]
机构：
[1] Sonix Inc, Springfield, VA 22152 USA
来源：
ACOUSTICAL IMAGING, VOL 26 | 2002年 / 26卷
关键词：
D O I：
暂无
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
引用
收藏
页码：353 / 361
页数：9
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