Transmission electron microscopy on magnetic phase transformations in functional materials

被引：11

作者：

Murakami, Y. ^{[1
]}

Yano, T. ^{[1
]}

Shindo, D. ^{[1
]}

Kainuma, R. ^{[1
]}

Arima, T. ^{[1
]}

机构：

[1] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan

来源：

METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 2007年 / 38A卷 / 04期

关键词：

D O I：

10.1007/s11661-007-9235-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This article reports our recent studies on the magnetic imaging by electron holography or Lorentz microscopy, which is combined with other supplernentary techniques related to transmission electron microscopy (TEM). By combining with dark-field imaging, the "one-to-one correspondence" between the magnetic domain walls and antiphase boundaries (APBs) in a ferromagnetic shape memory alloy (SMA) Ni2Mn(A1,Ga) was revealed. In order to examine both magnetism and conductivity in a nanoscale area, we have developed a double probe piezodriving holder, by which microprobes can be brought in contact with the portion of interest. The conductivity measurement can be simultaneously pet-formed with Lorentz microscopy or electron holography.

引用

页码：815 / 820

页数：6

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