X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene

被引：148

作者：

Yoshida, Hiroyuki ^{[1
]}

Inaba, Katsuhiko

Sato, Naoki

机构：

[1] Kyoto Univ, Inst Chem Res, Uji, Kyoto 6110011, Japan

[2] Rigaku Corp, Xray Res Lab, Akishima, Tokyo 1968666, Japan

来源：

APPLIED PHYSICS LETTERS | 2007年 / 90卷 / 18期

关键词：

D O I：

10.1063/1.2736193

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The structure of the thin film phase of pentacene was investigated using x-ray diffraction reciprocal space mapping (RSM). The crystal structure was found to be triclinic with the following lattice parameters: a=0.593 nm, b=0.756 nm, c=1.565 nm, alpha=98.6 degrees, beta=93.3 degrees, and gamma=89.8 degrees. Atomic positions were determined by comparing the observed RSM diffraction intensities with theoretical calculations. (C) 2007 American Institute of Physics.

引用

页数：3

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