A VISCOELASTIC-AWARE EXPERIMENTALLY-DERIVED MODEL FOR ANALOG RF MEMS VARACTORS

被引:0
|
作者
Hsu, Hao-Han [1 ]
Peroulis, Dimitrios [1 ]
机构
[1] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
关键词
BEHAVIOR; FILMS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we present, for the first time, an experimentally-extracted model for the spring constant and tuning range of an analog RF-MEMS varactor that includes viscoelastic effects in RF-MEMS devices. By utilizing a bi-state bias condition with one state lasting 60 minutes and the other 1 minute, this model focuses on capturing the true electromechanical behavior of the varactor. An experimental setup with very high long-term accuracy is created to measure capacitance of the varactor up to 1,370 hours. The impact of these effects and the effectiveness of the model are demonstrated on a tunable-resonator loaded with RF-MEMS varactors
引用
收藏
页码:783 / 786
页数:4
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