Thin film dielectric microstrip kinetic inductance detectors

被引:31
|
作者
Mazin, Benjamin A. [1 ]
Sank, Daniel [1 ]
McHugh, Sean [1 ]
Lucero, Erik A. [1 ]
Merrill, Andrew [1 ]
Gao, Jiansong [2 ]
Pappas, David [2 ]
Moore, David [3 ]
Zmuidzinas, Jonas [3 ]
机构
[1] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA
[2] Natl Inst Stand & Technol, Boulder, CO 80305 USA
[3] CALTECH, Dept Phys, Pasadena, CA 91125 USA
基金
美国国家航空航天局;
关键词
D O I
10.1063/1.3314281
中图分类号
O59 [应用物理学];
学科分类号
摘要
Microwave kinetic inductance detectors, or MKIDs, are a type of low temperature detector that exhibit intrinsic frequency domain multiplexing at microwave frequencies. We present the first theory and measurements on a MKID based on a microstrip transmission line resonator. A complete characterization of the dielectric loss and noise properties of these resonators is performed, and agrees well with the derived theory. A competitive noise equivalent power of 5 x 10(-17) W Hz(-1/2) at 10 Hz has been demonstrated. The resonators exhibit the highest quality factors known in a microstrip resonator with a deposited thin film dielectric. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3314281]
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页数:3
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