Indoor characterisation of thin-film PV modules installed for 4.6 years in desert conditions

被引：0

作者：

Alheloo, Ahmad ^{[1
]}

John, Jim Joseph ^{[1
]}

Albadwawi, Omar ^{[1
]}

Almheiri, Ali ^{[1
]}

Alhamadani, Hebatalla ^{[1
]}

Hassan, Shaikha ^{[1
]}

Alnuaimi, Aaesha ^{[1
]}

机构：

[1] Dubai Elect & Water Author DEWA, Res & Dev Ctr, Dubai, U Arab Emirates

来源：

2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) | 2020年

关键词：

PV module degradation; thin-film PV; CdTe; CIGS; PV reliability; DEGRADATION;

D O I：

10.1109/pvsc45281.2020.9300986

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Degradation of commercially available CdTe and CIGS PV modules installed in the desert conditions, are not well understood, because they have been in operation for relatively short period compared to crystalline silicon PV technology. In this paper, we investigate the degradation rate of both these thin-film technologies using indoor characterization methods. The calculated annual degradation rate of CdTe technology (1.3-2.2 percent/year) is lower than CIGS (5.3-8.8 /year). The main cause of this degradation is the reduction in fill factor caused by formation of permanent shunts. These shunts were characterized using Electroluminescence and microscopic imaging.

引用

页码：1489 / 1493

页数：5

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