DIBPro: Automatic diagnostic program generation tool

被引：0
|
作者：
Kalyanaraman, Venkat [1 ]
Kim, Bruce C. [2 ]
Variyam, Pramod [3 ]
Cherubal, Sasikumar [3 ]
机构：
[1] Texas Instruments Inc, Dallas, TX 75265 USA
[2] Univ Alabama, Tuscaloosa, AL 35487 USA
[3] Wi Quest Commun Inc, Allen, TX 75090 USA
来源：
2006 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2 | 2006年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper describes the design and implementation of a tool for generating automatic diagnostic programs for mixed-signal device interface boards (DIB). The tool can be utilized on any ATE platform.
引用
收藏
页码：595 / +
页数：2
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