Strain mapping accuracy improvement using super-resolution techniques

被引：12
|
作者：
Barcena-Gonzalez, G. [1 ]
Guerrero-Lebrero, M. P. [1 ]
Guerrero, E. [1 ]
Fernandez-Reyes, D. [2 ]
Gonzalez, D. [2 ]
Mayoral, A. [3 ,4 ]
Utrilla, A. D. [5 ]
Ulloa, J. M. [5 ]
Galindo, P. L. [1 ]
机构：
[1] Univ Cadiz, Dept Comp Sci & Engn, Cadiz 11519, Spain
[2] Univ Cadiz, Dept Mat Sci & Met Engn & Inorgan Chem, Cadiz 11519, Spain
[3] Univ Zaragoza, Inst Nanosci Aragon, Zaragoza, Spain
[4] Univ Zaragoza, Lab Adv Microscopies, Zaragoza, Spain
[5] Univ Politecn Madrid, Inst Syst Based Optoelect & Microtechnol ISOM, Madrid, Spain
来源：
JOURNAL OF MICROSCOPY | 2016年 / 262卷 / 01期
关键词：
High-resolution high-angular annular dark field; image reconstruction; strain analysis; CRYSTAL-STRUCTURE ANALYSIS; GEOMETRIC PHASE-ANALYSIS; IMAGES; ALGORITHM; NOISE; DRIFT;
D O I：
10.1111/jmi.12341
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.
引用
收藏
页码：50 / 58
页数：9
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