共 50 条
- [1] RESPONSE MEASUREMENT ACCURACY FOR OFF-RESONANCE EXCITATION IN ATOMIC FORCE MICROSCOPY PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, DETC 2010, VOL 4, 2010, : 517 - 524
- [2] Dissipation imaging with low amplitude off-resonance atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (7B): : 5325 - 5327
- [3] Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME, 2012, 134 (01):
- [4] Integrated force and displacement sensing in active microcantilevers for off-resonance tapping mode atomic force microscopy 2020 INTERNATIONAL CONFERENCE ON MANIPULATION, AUTOMATION AND ROBOTICS AT SMALL SCALES (MARSS 2020), 2020, : 24 - +
- [7] Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy JOURNAL OF COMPUTATIONAL AND NONLINEAR DYNAMICS, 2011, 6 (03):
- [8] High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, 2024, (205):