A method for measuring the gain of on-wafer antenna based on probe de-embedding technique

被引：0
|
作者：
Zhao, Rui [1 ]
Cai, Qing [2 ,3 ]
Wang, Yahai [1 ]
Yin, Zhijun [1 ]
Zhou, Yang [4 ]
机构：
[1] CETC, Res Inst 41, Qingdao 266555, Peoples R China
[2] Shanghai Inst Measurement & Testing Technol, Shanghai 201203, Peoples R China
[3] Shanghai Jiao Tong Univ, Sch Elect Informat & Elect Engn, Shanghai 200240, Peoples R China
[4] Sci & Technol Elect Test & Measurement Lab, Qingdao 266555, Peoples R China
来源：
2018 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY (ICMMT2018) | 2018年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The antenna gain is an important characterization parameter of antenna performance. This paper puts forward a method using single port calibration probes to de-embedding, which can effectively solve the probe of insertion loss due to probe used multiple times. This method can accurately measure actual insertion loss value of the probe and on-wafer antenna gain, and improve measurement uncertainty. The measured data and theoretical data have been used to verify the accuracy and convenience of the proposed method.
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页数：3
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