Effects of focused-ion-beam irradiation on perpendicular write head performance

The effects of focused-ion-beam (FIB) irradiation on writer performance were examined on a perpendicular recording system. The entire top pole was irradiated by FIB with ion doses from 0 to 300 pC/mum(2). PW50 and signal to noise ratio (SNR) were characterized using a spin stand before and after FIB irradiation. It was found that there is degradation of PW50 and SNR due to FIB irradiation. At the maximum dose (300 pC/mum(2)), PW50 increased by 33 nm (>30%) and SNR decreased by 5 dB (>25%). The degradation was attributed to the physical pole tip recession and the formation of a magnetic dead layer. The thickness of the magnetic dead layer was estimated by analyzing the write spacing loss. Using atomic force microscopy and stage current change monitored during FIB process, it was found that the entire 4-nm protective carbon layer was etched away with a dose of 25 pC/mum(2). This result implies that the degradation with ion doses <25 pC/mum(2) is exclusively due to damage to the magnetic layer at the pole surface due to Ga implantation. It was found that our experimental results are consistent with the conventional write spacing loss behavior. (C) 2003 American Institute of Physics.