The anomalous negative acoustoelectric current in single-electron transport devices

被引:3
|
作者
Song, L. [1 ]
Chen, S. W. [1 ]
He, J. H. [1 ]
Zhang, C. Y. [1 ]
Lu, C. [2 ]
Gao, J. [1 ,2 ]
机构
[1] Sichuan Univ, Dept Phys, Lab Mesoscop & Low Dimens Phys, Chengdu 610064, Peoples R China
[2] Natl Inst Measurement & Testing Technol, Chengdu 610021, Peoples R China
基金
中国国家自然科学基金;
关键词
Acoustoelectric effects; Quantum well devices; Surface acoustic wave; ACOUSTIC CHARGE-TRANSPORT; CHANNEL; DRIVEN; WAVES;
D O I
10.1016/j.ssc.2009.11.001
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We investigate the anomalous negative oscillations present in the frequency dependence of an acoustoelectric current by using surface acoustic wave devices. The time domain responses of the transmission performances for our devices show that the Bragg reflections from the second transducer have a strong effect. On the basis of the results measured, a new model is advanced for explaining the anomalous negative oscillations present in the I(f) characteristics. In addition in the negative direction, the acoustoelectric current measured as a function of the gate voltage is observed to be quantized. And the interpretation for the negative quantized plateaus present in the I(V-g) characteristics is also given. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:292 / 296
页数:5
相关论文
共 50 条
  • [1] The anomalous acoustoelectric current in single-electron transport devices with three pairs of shallow-etched gates
    Liu, L. B.
    Gao, J.
    Guo, H. Z.
    Zhang, W.
    He, J. H.
    PHYSICA B-CONDENSED MATTER, 2011, 406 (03) : 430 - 434
  • [2] High-frequency single-electron transport and the quantized acoustoelectric effect
    Cunningham, J
    Talyanskii, VI
    Shilton, JM
    Pepper, M
    Kristensen, A
    Lindelof, PE
    PHYSICA B, 2000, 280 (1-4): : 493 - 494
  • [3] Single-electron devices
    Ahmed, H
    Nakazato, K
    MICROELECTRONIC ENGINEERING, 1996, 32 (1-4) : 297 - 315
  • [4] Design of a single-electron current source for nanoelectronic devices
    Guimaraes, JG
    da Costa, JC
    MICROELECTRONICS JOURNAL, 2004, 35 (12) : 989 - 996
  • [5] Single-electron devices
    Weis, J
    CFN LECTURES ON FUNCTIONAL NANOSTRUCTURES, VOL 1, 2005, 658 : 87 - 121
  • [6] Negative differential conductance in silicon nanocrystal single-electron devices
    Sée, J
    Dollfus, P
    Galdin, S
    Hesto, P
    ESSDERC 2004: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, 2004, : 433 - 436
  • [7] Standards of current and capacitance based on single-electron tunneling devices
    Keller, MW
    RECENT ADVANCES IN METROLOGY AND FUNDAMENTAL CONSTANTS, 2001, 146 : 291 - 316
  • [8] Anomalous single-electron transfer in common-gate quadruple-dot single-electron devices with asymmetric junction capacitances
    Imai, Shigeru
    Ito, Masato
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (06)
  • [9] Single-electron tunneling devices as a possible dc current standard
    Furlan, M
    Eichenberger, AL
    Kach, E
    Jeanneret, B
    Jeckelmann, B
    HELVETICA PHYSICA ACTA, 1998, 71 : 5 - 6
  • [10] Classification of single-electron devices
    Abramov, II
    Novik, EG
    SEMICONDUCTORS, 1999, 33 (11) : 1254 - 1259