Time-resolved energy-dispersive diffraction from X-FEL spontaneous emission: a proposal for sub-picosecond pumps & probe structural investigations

被引：0

作者：

Albertini, VR ^{[1
]}

Paci, B ^{[1
]}

Perfetti, P ^{[1
]}

机构：

[1] CNR, Ist Struttura Mat, I-00133 Rome, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 533卷 / 03期

关键词：

free electron laser; sub-picosecond structural studies; energy dispersive X-ray diffraction;

D O I：

10.1016/j.nima.2004.06.253

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The forthcoming generation of X-ray machines, based on Free Electron Laser (X-FEL) technology, should provide ultra-short pulses that may be used to probe the real-time structural evolution of a system activated by an optical laser pump. Unfortunately, the sub-picosecond synchronization of the pump and probe pulses produced by two independent sources is, at present, one of the main obstacles that needs to be overcome. Here we propose a new approach for carrying out time-resolved diffraction studies of evolving systems, which aims to bypass the synchronization problem. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：584 / 590

页数：7

共 9 条

[1] An incoherent sub-picosecond X-ray source for time-resolved X-ray-diffraction experiments
Feurer, T
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APPLIED PHYSICS B-LASERS AND OPTICS, 2001, 72 (01): : 15 - 20
[2] An incoherent sub-picosecond X-ray source for time-resolved X-ray-diffraction experiments
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[8] Electric field effect on chemical and phase equilibria in nano-TiB2-TiO2-TiBO3 system at <650 °C: an in situ time-resolved energy dispersive x-ray diffraction study with an ultrahigh energy synchrotron probe
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JOURNAL OF MATERIALS RESEARCH, 2017, 32 (02) : 482 - 494
[9] Electric field effect on chemical and phase equilibria in nano-TiB2–TiO2–TiBO3 system at <650 °C: an in situ time-resolved energy dispersive x-ray diffraction study with an ultrahigh energy synchrotron probe
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Journal of Materials Research, 2017, 32 : 482 - 494

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