A Case Study of Failure Analysis and root cause identification on ESD-induced Breakdown

被引：0
|
作者：
Liu, Hongmin [1 ]
Li, Zhe [1 ]
Weng, Zheng [1 ]
机构：
[1] Chinese Acad Sci, Natl Space Sci Ctr, 1 Zhongguancun Nanertiao, Beijing 100190, Peoples R China
来源：
ISTFA 2016: CONFERENCE PROCEEDINGS FROM THE 42ND INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS | 2016年
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D O I：
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：291 / 293
页数：3
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