3D ToF-SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate

被引：1
|
作者：
Zhang, Lei [1 ]
Dai, Chunli [1 ]
Zhang, Jie [1 ]
机构：
[1] Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China
来源：
SURFACE AND INTERFACE ANALYSIS | 2020年 / 52卷 / 05期
基金：
国家重点研发计划;
关键词：
3D SIMS; ceramic coating; diffusion; interface; ToF-SIMS; zircaloy; THIN-FILM; PROGRESS;
D O I：
10.1002/sia.6715
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF-SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr2AlC ceramic coating and Zircaloy substrate system was investigated in both the as-deposited and postannealed states. In terms of the 3D view and imaging of CsAl+ after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800 degrees C for only 5 minutes compared with that in the as-deposited sample.
引用
收藏
页码：306 / 310
页数：5
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