High spatial resolution strain measurements within bulk materials by slit-imaging

被引:0
|
作者
Lienert, U [1 ]
Martins, R [1 ]
Grigull, S [1 ]
Pinkerton, M [1 ]
Poulsen, HF [1 ]
Kvick, Å [1 ]
机构
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High energy synchrotron radiation is employed for residual strain measurements from local gauge volumes within the bulk of polycrystalline materials. The longitudinal spatial resolution is defined by placing a narrow imaging slit behind the sample and recording the intensity distribution on a position sensitive detector. It is shown that the sample to slit distance can be increased without sacrificing longitudinal resolution by applying a reconstruction technique. Hence, space is provided for large samples and sample environments. The reconstruction technique is described and validated by measuring the residual strain profile of a shot-peened Al sample. A longitudinal gauge length of 95 mu m is achieved at 52 keV with a sample to slit distance of 10 cm.
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页码:241 / 246
页数:6
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