A Novel Patterned Fabric Defect Detection Algorithm based on GHOG and Low-rank Recovery

被引:0
|
作者
Gao, Guangshuai [1 ]
Zhang, Duo [2 ]
Li, Chunlei [1 ]
Liu, Zhoufeng [1 ]
Liu, Qiuli [1 ]
机构
[1] Zhongyuan Uniers Technol, Sch Elect & Informat Engn, Zhengzhou 450007, Henan, Peoples R China
[2] Beijing Inst Technol, Sch Comp Sci, Beijing 100081, Peoples R China
基金
中国国家自然科学基金;
关键词
patterned fabric; GHOG; low-rank recovery; fabric image; defect detection; MACHINE VISION; INSPECTION;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to accurately detect the patterned fabric defects, a novel patterned fabric detection algorithm based on Gabor-HOG (GHOG) and low-rank recovery is proposed. Firstly, Gabor filter preprocess the pattern fabric image to generate the Gabor maps, and then HOG feature is extracted from the blocks of Gabor maps with size of 16x16. Secondly, the feature vectors GHOG of all blocks is stacked into a feature matrix, each column represents an image block. Thirdly, an efficient low rank recovery model is built for the feature matrix, and is decomposed into a low-rank matrix (background information) and a sparse matrix (defect information) by the alternative direction multiplier method (ADMM). Finally, the saliency map generated by sparse matrix is segmented by the improved optimal threshold algorithm, to locate the defect regions. Experiment results show that recovery the proposed method can effectively detect patterned fabric defect, and outperforms the state-of-the-art methods.
引用
收藏
页码:1118 / 1123
页数:6
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