Intensity noise properties of Nd:YVO4 microchip lasers pumped with an amplitude squeezed diode laser

被引:12
|
作者
Becher, C [1 ]
Boller, KJ [1 ]
机构
[1] Univ Kaiserslautern, Fachbereich Phys, D-67663 Kaiserslautern, Germany
关键词
D O I
10.1016/S0030-4018(97)00588-9
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report on intensity noise measurements of single-frequency Nd:YVO4 microchip lasers optically pumped with amplitude squeezed light from an injection-locked diode laser. Calibrated homodyne measurements show a minimum intensity noise of 10.1 dB above the SQL at a frequency of 100 kHz. The measured intensity noise spectra are described with high accuracy by a theoretical model based on the quantum mechanical Langevin rate equations, including classical and quantum noise sources. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:366 / 374
页数:9
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