The formation of symmetric SiC bi-nanowires with a Y-shaped junction

被引:5
|
作者
Wu, Cuilan [1 ,2 ]
Liao, Xiaozhou [2 ]
Chen, Jianghua [1 ]
机构
[1] Hunan Univ, Ctr High Resolut Electron Microscopy, Coll Mat Sci & Engn, Changsha 410082, Hunan, Peoples R China
[2] Univ Sydney, Sch Aerosp Mech & Mechatron Engn, Sydney, NSW 2006, Australia
基金
澳大利亚研究理事会;
关键词
TILT GRAIN-BOUNDARIES; SILICON; GROWTH; MORPHOLOGY; WHISKER; PHOTOLUMINESCENCE;
D O I
10.1088/0957-4484/21/40/405303
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Transmission electron microscopy was used to investigate the formation mechanism of SiC bi-nanowires (BNW) with a Y-shaped junction. Different from the previously reported growth mechanisms, our study suggests that when two individual nanowires that are growing through the vapor-liquid-solid mechanism meet with a proper angle, they will merge and form a straight and symmetric BNW with its two side-branches maintaining their original crystallographic orientations and sharing the same crystallographic growth direction, which can be < 110 >, < 112 > or < 113 >, depending on the meeting angle between the two initial nanowires. According to our observations, a growth model of SiC BNWs with a Y-shaped junction was proposed. The radii and the microstructure of the BNWs are controlled to a certain extent by the meeting angle and the radii of the two SiC single NWs.
引用
收藏
页数:8
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