Meander-Type Transmission Line Design for On-Wafer TRL Calibration up to 330GHz

被引:0
|
作者
Cabbia, Marco [1 ]
Deng, Marina [1 ]
Fregonese, Sebastien [1 ]
Yadav, Chandan [1 ]
Curutchet, Arnaud [1 ]
De Matos, Magali [1 ]
Celi, Didier [2 ]
Zimmer, Thomas [1 ]
机构
[1] IMS UMR 5218, Talence, France
[2] STMicroelectronics, Grenoble, France
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页数:1
相关论文
共 28 条
  • [1] Meander-Type Transmission Line Design for On-Wafer TRL Calibration up to 330GHz
    Cabbia, Marco
    Deng, Marina
    Fregonese, Sebastien
    Yadav, Chandan
    Curutchet, Arnaud
    De Matos, Magali
    Celi, Didier
    Zimmer, Thomas
    2020 50TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2020,
  • [2] Meander-Type Transmission Line Design for On-Wafer TRL Calibration up to 330 GHz
    Cabbia, Marco
    Deng, Marina
    Fregonese, Sebastien
    Yadav, Chandan
    Curutchet, Arnaud
    De Matos, Magali
    Celi, Didier
    Zimmer, Thomas
    2020 50TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2020, : 979 - 982
  • [3] Meander Type Transmission Line Design for On Wafer TRL Calibration
    Potereau, Manuel
    Deng, Marina
    Raya, Christian
    Ardouin, Bertrand
    Aufinger, Klaus
    Ayela, Cedric
    De Matos, Magali
    Curutchet, Arnaud
    Fregonese, Sebastien
    Zimmer, Thomas
    2016 46TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2016, : 377 - 380
  • [4] Meander-Type Lines: An Innovative Design for On-Wafer TRL Calibration for mmW and Sub-mmW Frequencies Measurements
    Cabbia, Marco
    Fregonese, Sebastien
    Deng, Marina
    Curutchet, Arnaud
    Yadav, Chandan
    Celi, Didier
    De Matos, Magali
    Zimmer, Thomas
    IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, 2021, 11 (04) : 367 - 374
  • [5] Design of On-Wafer TRL Calibration Kit for InP Technologies Characterization up to 500 GHz
    Deng, Marina
    Mukherjee, Chhandak
    Yadav, Chandan
    Fregonese, Sebastien
    Zimmer, Thomas
    De Matos, Magali
    Quan, Wei
    Arabhavi, Akshay Mahadev
    Bolognesi, Colombo R.
    Wen, Xin
    Luisier, Mathieu
    Raya, Christian
    Ardouin, Bertrand
    Maneux, Cristell
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (12) : 5441 - 5447
  • [6] 220GHz on-wafer measurement based on TRL calibration method
    Lu Haiyan
    Cheng Wei
    Zhou Zhijiang
    Zhou Jianjun
    Wang Yuan
    Kong Yuechan
    Chen Tangshen
    PROCEEDINGS OF 2015 IEEE 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI), VOL. 2, 2015, : 868 - 871
  • [7] A New On-wafer Multi line Thru-Reflect-Line (TRL) Calibration Standard Design
    Lu, Haiyan
    Zhou, Zhijiang
    Chengwei
    Zhou, Jianjun
    Chen, Tangshen
    Chen, Chen
    PROCEEDINGS OF 2014 3RD ASIA-PACIFIC CONFERENCE ON ANTENNAS AND PROPAGATION (APCAP 2014), 2014, : 934 - 936
  • [8] Comparison of On-Wafer TRL Calibration to ISS SOLT Calibration With Open-Short De-Embedding up to 500 GHz
    Fregonese, Sebastien
    Deng, Marina
    De Matos, Magali
    Yadav, Chandan
    Joly, Simon
    Plano, Bernard
    Raya, Christian
    Ardouin, Bertrand
    Zimmer, Thomas
    IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, 2019, 9 (01) : 89 - 97
  • [9] On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz
    Probst, Thorsten
    Zinal, Sherko
    Doerner, Ralf
    Arz, Uwe
    2018 91ST ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG): WIDEBAND MODULATED TEST SIGNALS FOR NETWORK ANALYSIS OF WIRELESS INFRASTRUCTURE BUILDING BLOCKS, 2018,
  • [10] A 65-77 GHz low power, meander-type transmission line CMOS low-noise amplifier
    Huang, Zhe-Yang
    Chen, Chun-Chieh
    Hung, Chung-Chih
    IEICE ELECTRONICS EXPRESS, 2015, 12 (13):