High-resolution examination of recording marks in phase-change media using a scanning near-field optical microscope

被引：9
|
作者：
Tadokoro, T
Saiki, T
Yusu, K
Ichihara, K
机构：
[1] JASCO Corp, Spectroscop Instruments Div, Hachioji, Tokyo 1928537, Japan
[2] Kanagawa AcadSci & Technol, Takatsu Ku, Kawasaki, Kanagawa 2130012, Japan
[3] Toshiba Corp, Ctr Corp Res & Dev, Saiwai Ku, Kawasaki, Kanagawa 2128582, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 6A期
关键词：
phase-change; DVD-RAM; recording mark; scanning near-field optical microscope; probe tip; carrier-to-noise ratio;
D O I：
10.1143/JJAP.39.3599
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Recording marks in digital versatile disc-random access memory (DVD-RAM) were examined using a scanning near-field optical microscope (SNOM) incorporating an improved probe tip design. The marks were recorded on an experimental DVD-RAM medium with a track-pitch of 0.6 mu m. The tip size of the SNOM was made wider than the track width in order tb avoid optical ghosting arising from the track edge. The recording power was varied in order to investigate the dependence of the mark shape on power and it was found that the mark shape correlated well with the reproduced signal. The SNOM is considered-to be a good candidate for a practical characterization tool for optical recording media.
引用
收藏
页码：3599 / 3602
页数：4
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