In-situ TEM study of crystallisation of amorphous SbOx films

被引：0
|
作者：
Nayak, R [1 ]
PetfordLong, AK [1 ]
Doole, RC [1 ]
Afonso, CN [1 ]
机构：
[1] UNIV OXFORD,DEPT MAT,OXFORD OX1 3PH,ENGLAND
来源：
IN SITU ELECTRON AND TUNNELING MICROSCOPY OF DYNAMIC PROCESSES | 1996年 / 404卷
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中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：217 / 222
页数：6
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