Noise reduction is crucial to mixed-signal ASIC design success (Part I)

被引：0
|
作者：
Twomey, J [1 ]
机构：
[1] IBM Microelect, RF IC Design Grp, San Diego, CA USA
来源：
ELECTRONIC DESIGN | 2000年 / 48卷 / 22期
关键词：
Integrated circuit design;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：123 / +
页数：5
相关论文
共 50 条
  • [1] Noise reduction is crucial to mixed-signal ASIC design success (part II)
    Twomey, J
    ELECTRONIC DESIGN, 2000, 48 (25) : 101 - +
  • [2] Mixed-signal ASIC noise
    Falcon, CB
    ELECTRONIC ENGINEERING DESIGN, 2002, 74 (906): : 21 - +
  • [3] Mixed-signal ASIC noise
    Falcon, Carl B.
    Electronic Engineering (London), 2002, 74 (906): : 27 - 28
  • [4] The mixed-signal asic design course at Twente
    Tangelder, RJWT
    Gerez, SH
    Kerkhoff, HG
    Klumperink, EAM
    Smit, J
    Snijders, H
    Speek, H
    De Vries, H
    MICROELECTRONICS EDUCATION, 1998, : 169 - 172
  • [5] Mixed-signal ASIC tool
    Computer Design, 1991, 30 (12):
  • [6] ASIC DESIGN SYSTEM ADDRESSES MIXED-SIGNAL NEEDS
    CHIN, S
    ELECTRONIC PRODUCTS MAGAZINE, 1990, 33 (02): : 21 - 21
  • [7] MIXED-SIGNAL ASIC TOOLSET OFFERS ANALOG DESIGN FOR TESTABILITY
    TUCK, B
    COMPUTER DESIGN, 1991, 30 (12): : 126 - 127
  • [8] Mixed signal asic design, Part II
    Electronic Product Design, 1995, 16 (11):
  • [9] SOFTWARE LAGS BEHIND NEEDS OF MIXED-SIGNAL ASIC DESIGN
    COSTON, WT
    COMPUTER DESIGN, 1992, 31 (10): : 111 - 111
  • [10] Mixed-signal testing at the ASIC design course at Twente University
    Tangelder, RJWT
    De Vries, H
    Klumperink, EAM
    Snijders, H
    Kerkhoff, HG
    Smit, J
    Gerez, SH
    Speek, H
    MICROELECTRONICS EDUCATION, 2000, : 205 - 208
12345