Research on Test System of Memory Combination based on PXI Bus

被引：0
|
作者：
Ma Liyuan [1 ]
Wang Tianhui [1 ]
Zhang Yansheng [1 ]
机构：
[1] Mech Engn Coll, Dept 4, Shijiazhuang 050003, Hebei, Peoples R China
来源：
ISTM/2009: 8TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6 | 2009年
关键词：
PXI bus; March; Lab VIEW; Database; Memory;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Aim at the characteristics of memory combination, The thought of "module test" is put forwarded, the whole fault is reduce to three types data bus, address bus and memory unit. In order to decrease test time, new march algorithm is used on the test of memory unit. The software adopt method that test procedure and test information is separated. In the test time, main procedure invoke test generating and test sequence which in the database. Generally, database is used to carry out the portability of the software. The hardware relay on PXI bus, which have high reliability and flexibility. According to requirement analysis, private adapter which guarantee stabilized power and synchronous signal is designed.
引用
收藏
页码：255 / 258
页数：4
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