Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

被引：40
|
作者：
Senthil, K
Mangalaraj, D [1 ]
Narayandass, SK
Adachi, S
机构：
[1] Bharathiar Univ, Dept Phys, Thin Film Lab, Coimbatore 641046, Tamil Nadu, India
[2] Gunma Univ, Fac Engn, Dept Elect Engn, Kiryu, Gunma 3768515, Japan
来源：
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2000年 / 78卷 / 01期
关键词：
CdS; optical constants; spectroscopic ellipsometry; vacuum evaporation; refractive index; optical absorption;
D O I：
10.1016/S0921-5107(00)00510-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Optical constants of vacuum-evaporated CdS thin film have been determined by spectroscopic ellipsometry in the photon energy range from 1.2 to 5.5 eV at room temperature. The dielectric constant values were found to be substantially lower than those for the bulk CdS. The optical constants of the film were also determined using the optical transmittance measurements and the results were discussed. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码：53 / 58
页数：6
相关论文
共 50 条
  • [1] Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry
    Sridharan, M
    Narayandass, SK
    Mangalaraj, D
    Lee, HC
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2002, 13 (08) : 471 - 476
  • [2] Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry
    M. Sridharan
    Sa. K. Narayandass
    D. Mangalaraj
    Hee Chul Lee
    Journal of Materials Science: Materials in Electronics, 2002, 13 : 471 - 476
  • [3] Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin films
    Venkatachalam, S.
    Soundararajan, D.
    Peranantham, P.
    Mangalaraj, D.
    Narayandass, Sa. K.
    Velumani, S.
    Schabes-Retchkiman, P.
    MATERIALS CHARACTERIZATION, 2007, 58 (8-9) : 715 - 720
  • [4] OPTICAL-CONSTANTS OF VACUUM-EVAPORATED POLYCRYSTALLINE CADMIUM SELENIDE THIN-FILMS
    PAL, U
    SAMANTA, D
    GHORAI, S
    CHAUDHURI, AK
    JOURNAL OF APPLIED PHYSICS, 1993, 74 (10) : 6368 - 6374
  • [5] OPTICAL CONSTANTS OF VACUUM-EVAPORATED SILVER FILMS
    HUEBNER, RH
    HAMM, RN
    MACRAE, RA
    ARAKAWA, ET
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (12) : 1434 - &
  • [6] Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry
    Kana, J. B. Kana
    Ndjaka, J. M.
    Vignaud, G.
    Gibaud, A.
    Maaza, M.
    OPTICS COMMUNICATIONS, 2011, 284 (03) : 807 - 812
  • [7] Characterization of vacuum-evaporated ZnSe thin films
    Venkatachalam, S.
    Mangalaraj, D.
    Narayandass, Sa. K.
    PHYSICA B-CONDENSED MATTER, 2007, 393 (1-2) : 47 - 55
  • [8] Characterization of vacuum-evaporated ZnSe thin films
    Venkatachalam, S.
    Jeyachandran, Y. L.
    Sureshkumar, P.
    Dhayalraj, A.
    Mangalaraj, D.
    Narayandass, Sa. K.
    Velumani, S.
    MATERIALS CHARACTERIZATION, 2007, 58 (8-9) : 794 - 799
  • [9] OPTICAL-PROPERTIES OF VACUUM-EVAPORATED CDTE THIN-FILMS
    ARANDA, J
    MORENZA, JL
    ESTEVE, J
    CODINA, JM
    THIN SOLID FILMS, 1984, 120 (01) : 23 - 30
  • [10] Argon and nitrogen implantation effects on the structural and optical properties of vacuum evaporated cadmium sulphide thin films
    Senthil, K
    Mangalaraj, D
    Narayandass, SK
    Hong, BY
    Roh, Y
    Park, CS
    Yi, Y
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2002, 17 (02) : 97 - 103
12345