Additive-subtractive two-wavelength ESPI contouring by using a synthetic wavelength phase shift

被引：24
|
作者：
Hack, E [1 ]
Frei, B [1 ]
Kastle, R [1 ]
Sennhauser, U [1 ]
机构：
[1] Swiss Fed Labs Mat Testing & Res, CH-8600 Dubendorf, Switzerland
来源：
APPLIED OPTICS | 1998年 / 37卷 / 13期
关键词：
D O I：
10.1364/AO.37.002591
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The addition correlation of two speckle fields by simultaneous illumination at different wavelengths is used for object contouring in a Twyman-Green-type interferometer. Fringe visibility is enhanced when the stochastic speckle background intensity obtained from a reference plane modulation is subtracted. We calculate the contour phase map by using a phase-shift algorithm in the synthetic wavelength. A comparison with a sequential illumination, phase difference method based on a laser wavelength phase shift is given. The test setup does not need to be stable on an interferometric scale, and therefore a method is provided that lends itself to applications in noisy environments. (C) 1998 Optical Society of America.
引用
收藏
页码：2591 / 2597
页数：7
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