Complex Dielectric Permittivity of Engineering and 3D-Printing Polymers at Q-Band

被引:28
|
作者
Reyes, Nicolas [1 ]
Casado, Francisco [1 ]
Tapia, Valeria [2 ]
Jarufe, Claudio [1 ]
Finger, Ricardo [2 ]
Bronfman, Leonardo [2 ]
机构
[1] Univ Chile, Dept Elect Engn, Santiago 2007, Chile
[2] Univ Chile, Dept Astron, Camino Observ, Santiago 1515, Chile
关键词
Microwave characterization; Dielectric permittivity; Tangent loss; MILLIMETER; OPTICS; GHZ;
D O I
10.1007/s10762-018-0528-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report experimental values of the complex dielectric permittivity of a wide variety of engineering polymers. Measurements were done using the filling waveguide method at Q-band (30-50 GHz), being representative of the values over the millimeter wave regime. This method has a high accuracy, providing excellent wide-bandwidth characterization. Measured samples include the most common engineering materials as polyamide, polyethylene, polytetrafluoroethylene, polyoxymethylene, polylactic acid, phenol formaldehyde resin, polypropylene, polyvinyl chloride, acrylonitrile butadiene styrene, polyphenyle sulfide, and polyether ether ketone. Results are comprehensive and represent an important contribution to the technical literature which lacks of material measurements at these frequencies. Of particular interest are samples of 3D printed materials and high performance polymers, that will probably find new and novel applications in the field of microwave components and antennas for the millimeter wave band.
引用
收藏
页码:1140 / 1147
页数:8
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