High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices

被引：6

作者：

Cimmino, D. ^{[1
,2
]}

Busca, R. ^{[1
,2
]}

Ferrero, S. ^{[1
]}

Pirri, F. ^{[1
]}

Richieri, G. ^{[2
]}

Carta, R. ^{[2
]}

机构：

[1] Politecn Torino, DISAT, Turin, Italy

[2] Vishay Semicond Italiana SPA, Borgaro Torinese, Italy

来源：

MICROELECTRONICS RELIABILITY | 2019年 / 100卷

关键词：

MODULES;

D O I：

10.1016/j.microrel.2019.06.011

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High Voltage Temperature Humidity Bias Test (THB-HV) is currently the state of the art test method for reliability evaluation of power devices in high humidity environments at high voltage. These conditions have become especially significant in the case of power modules for the automotive industry and other applications in harsh environments. In this research work, a custom system for active monitoring of THB-HV testing is developed and customized, in order to evaluate different testing methodologies, intercept device degradation in real time, and allow for a controlled and more accurate failure analysis of the DUTs.

引用

页数：5

共 13 条

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