Simulation of pulse shortening phenomena in high power microwave tube using PIC method

被引:17
|
作者
Gong, YB [1 ]
Zhang, Z
Wei, YY
Meng, FB
Fan, ZK
Wang, WX
机构
[1] Univ Elect Sci & Technol China, Key Lab High Power Microwave Devices, Chengdu 610054, Peoples R China
[2] China Acad Engn Phys, Inst Appl Elect, Mianyang 621900, Peoples R China
关键词
high power microwave tube; relativistic backward wave tube; pulse shortening; particle-in-cell;
D O I
10.7498/aps.53.3990
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Pulse shortening is an universal phenomenon in high-power microwave tubes, which hinders the improvement of microwave output energy. So far, it is also an unresolved problem in the field of high-power microwave devices. In this paper, the relativistic backward wave tube (RBWO) is treated as an example to. study the pulse shortening phenomena. The influences of explosive emission in the inner surface of RBWO and fluctuation of the relativistic electron beam on the pulse width and output power are investigated by means of the particle-in-cell( PIC) method. Through the simulation results, some useful conclusions have been drawn. The explosive emission in the surface of the slow wave structure due to intense electric field is one of the most important factors causing pulse shortening in high-power microwave tube. The fluctuation of the electron beam can also lead to pulse shortening. Some methods to overcome pulse shortening are given in this paper.
引用
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页码:3990 / 3995
页数:6
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