From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology)

被引：16
|
作者：
Dahlgaard, JJ [1 ]
Dahlgaard, SMP [1 ]
机构：
[1] Linkoping Univ, Dept Business Adm, Div Qual Technol, Linkoping, Sweden
来源：
TOTAL QUALITY MANAGEMENT | 2002年 / 13卷 / 08期
关键词：
D O I：
10.1080/09544120200000003
中图分类号：
C93 [管理学];
学科分类号：
12 ; 1201 ; 1202 ; 120202 ;
摘要：
With the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to building the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed.
引用
收藏
页码：1069 / 1085
页数：17
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