Ellipsometry in the study of dynamic material properties

被引:0
|
作者
Obst, AW [1 ]
Alrick, KR [1 ]
Anderson, WW [1 ]
Boboridis, K [1 ]
Buttler, WT [1 ]
Lamoreaux, SK [1 ]
Marshall, BR [1 ]
Montgomery, SL [1 ]
Payton, JR [1 ]
Wilke, MD [1 ]
机构
[1] Los Alamos Natl Lab, Div Phys, Los Alamos, NM 87545 USA
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中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Measurements of the time-dependent absolute temperature of high-explosive (HE) shocked surfaces provide valuable constraints on the equations-of-state (EOS) of materials and of the state of ejecta from those surfaces. In support of these dynamic surface temperature measurements, we are developing techniques for measuring the dynamic surface emissivity of shocked metals in the near-infrared (IR). These consist of time-dependent laser polarimetric measurements, using several approaches. We include here a discussion of these polarimeter techniques. Polarimetry permits an accurate determination of the dynamic emissivity at a given wavelength, and may also provide a signature of melt in shocked metals.
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页码:1247 / 1250
页数:4
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