Measurement of contact resistance for copper and aluminium conductors

被引:5
|
作者
Napieralska-Juszczak, Ewa [1 ]
Komeza, Krzysztof [3 ]
Morganti, Fabrice [1 ]
Sykulski, Jan K. [2 ]
Vega, Guillaume [4 ]
Zeroukhi, Youcef [1 ]
机构
[1] UA, LSEE, Technoparc Futura, F-62400 Bethune, France
[2] Univ Southampton, Sch Elect & Comp Sci, Southampton SO17 1BJ, Hants, England
[3] Tech Univ Lodz, Inst Mechatron & Informat Syst, Stefanowskiego 18-2, Lodz, Poland
[4] Nexans, Bd Marais, F-62300 Lens, France
关键词
Contact resistance; contact area; compressing force; mechanical deformation; multi-strand cables; IN-CONDUIT CONDUCTORS; HARDNESS; STRANDS;
D O I
10.3233/JAE-160025
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
During manufacturing of multi-strand cables the conductors are subjected to twisting and pressing which result in a creation of contact regions between individual wires. The resistivity of such contact regions differs from the resistivity of copper or aluminum. In this paper the resistivity is established by comparing measurements of resistivity with simulations using a finite element method. The non-homogeneity of the contact imprint has been accounted for and the presented results show the dependence of the contact resistance on several parameters, including compression force, imprint depth, intersecting angle and stranding pitch.
引用
收藏
页码:617 / 629
页数:13
相关论文
共 50 条
  • [1] Contact connections in aluminium and magnesium conductors
    Schulze, R
    Zeiss, B
    ZEITSCHRIFT DES VEREINES DEUTSCHER INGENIEURE, 1940, 84 : 399 - 402
  • [2] Influence of the Bead Geometry and the Tin Layer on the Contact Resistance of Copper Conductors
    Dyck, Tobias
    Bund, Andreas
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 8 (10): : 1863 - 1868
  • [3] WELDING OF COPPER RAILWAY CONTACT CONDUCTORS
    LEONTEV, DV
    WELDING PRODUCTION, 1970, 17 (09): : 30 - &
  • [4] On the contact resistance of semi-conductors
    Davydov, B
    JOURNAL OF PHYSICS-USSR, 1939, 1 : 167 - 174
  • [5] Architectured hybrid conductors: Aluminium with embedded copper helix
    Lapovok, R.
    Popov, V. V., Jr.
    Qi, Y.
    Kosinova, A.
    Berner, A.
    Xu, C.
    Rabkin, E.
    Kulagin, R.
    Ivanisenko, J.
    Baretzky, B.
    Prokof'eva, O. V.
    Sapronov, A. N.
    Prilepo, D. V.
    Beygelzimer, Y.
    MATERIALS & DESIGN, 2020, 187
  • [6] Friction Properties at the Contact Interfaces of Overhead Line Aluminium Conductors
    Omrani, Amine
    Dieng, Lamine
    Langlois, Sebastien
    Van Dyke, Pierre
    IEEE TRANSACTIONS ON POWER DELIVERY, 2022, 37 (01) : 442 - 448
  • [7] Selective chemical doping of carbon nanotube conductors to reduce contact resistance with copper in ultrasonic welds
    Broderick, Daniel L.
    Boyd, Samuel J.
    Rossi, Jamie E.
    Landi, Brian J.
    CARBON, 2024, 227
  • [8] RESISTANCE MEASUREMENT FOR COPPER-COPPER CONTACT RELATIVE TO CURRENT DENSITIES AND INCREASED PRESSURES
    BOISSADY, C
    POSTEL, C
    RIOUXDAM.F
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1974, 279 (22): : 527 - 530
  • [9] SIMULATION TECHNIQUES OF THE CONTACT RESISTANCE IN ADHESIVE CONDUCTORS
    Tapu, Ermina
    Tapu, Ruxandra
    Simion, Ionel
    METALURGIA INTERNATIONAL, 2009, 14 (05): : 45 - 51
  • [10] CONTACT RESISTANCE BETWEEN SUPERCONDUCTORS AND NORMAL CONDUCTORS
    BEDARD, F
    MEISSNER, H
    PHYSICAL REVIEW, 1955, 98 (05): : 1539 - 1539