Polarimetry of moonlight: A new method for determining the refractive index of the lunar regolith

We present a new method for remotely measuring the refractive index of the lunar regolith, using polarised moonlight. Umov's Law correlates the polarisation (P-max) of scattered moonlight and the albedo (A) of the scattering lunar regolith. We discuss how deviations from this correlation have previously been linked to the so-called 'Polarimetric Anomaly Parameter', (P-max)(a)A, which was proposed by Shkuratov and others as being related to variations in regolith grain size. We propose a reinterpretation of that parameter. We develop models of light scattering by regolith grains which predict that variation in the refractive index of regolith grains causes deviations from Umov's Law. Variations in other grain parameters such as grain size and degree of space weathering do not produce this deviation. The models are supported by polarimetric measurements on powdered terrestrial materials of differing refractive index. We derive a simple formula to express the relationship between refractive index and the deviation from Umov's Law and apply it to telescopic measurements of regions of the lunar surface. We show that the Aristarchus Plateau and the Marius Hills regions both comprise materials of unusually low refractive index. These results are consistent with recent estimates of the mineralogy of those areas. Picard and Peirce craters, in Mare Crisium, are shown to contain material of low refractive index similar to highland regions, as has been suggested by earlier studies of these craters. (C) 2015 Elsevier Inc. All rights reserved.