RF Hardware-in-the-Loop Technologies Drive Embedded System Test

被引：0
|
作者：
Hall, David A. [1 ]
机构：
[1] Natl Instruments, Austin, TX 78759 USA
来源：
MICROWAVE JOURNAL | 2017年 / 60卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：32 / +
页数：4
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