Optimization of thermal interface materials for electronics cooling applications

被引:36
|
作者
Singhal, V [1 ]
Siegmund, T [1 ]
Garimella, SV [1 ]
机构
[1] Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
关键词
contact resistance reduction; electronics cooling; finite element analysis; interface materials; thermal contact conductance;
D O I
10.1109/TCAPT.2004.828587
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thermal interface materials (TIMs) are used in electronics cooling applications to decrease the thermal contact resistance between surfaces in contact. A methodology to determine the optimal volume fraction of filler particles,in TIMs for minimizing the thermal contact resistance is presented. The method uses finite element analysis to solve the coupled thermo-mechanical problem. It is shown that there exists an optimal filler volume fraction which depends not only on the distribution of the filler particles in a TIM but also on the thickness of the TIM layer, the contact pressure and the shape and the size of the filler particles. A contact resistance alleviation factor is defined to quantify the effect of these parameters on the contact conductance with the use of TIMs. For the filler and matrix materials considered-platelet-shaped boron nitride filler particles in a silicone matrix-the maximum observed enhancement in contact conductance with the use of TIMs was by a factor of as much as 9.
引用
收藏
页码:244 / 252
页数:9
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