Electron spin resonance of substitutional nitrogen in silicon

被引:8
|
作者
Belli, M. [1 ]
Fanciulli, M. [1 ,2 ]
Batani, D. [3 ,4 ]
机构
[1] IMM CNR, Lab MDM, I-20864 Agrate Brianza, MB, Italy
[2] Univ Milano Bicocca, Dipartmento Sci Mat, I-20126 Milan, Italy
[3] Univ Bordeaux, CEA, CNRS, CELIA Ctr Laser Intense Applicat,UMR 5107, F-33405 Talence, France
[4] Univ Milano Bicocca, Dipartmento Fis, I-20126 Milan, Italy
关键词
OFF-CENTER IMPURITIES; MAGNETIC-RESONANCE; PARAMAGNETIC-RES; DEFECTS; DONORS; RELAXATION; SHALLOW; STRESS; SPECTROSCOPY; CENTERS;
D O I
10.1103/PhysRevB.89.115207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The development of silicon-based nanoscale technology for the realization of single electron, single spin quantum devices demands deep donor-based systems to achieve a major breakthrough in the field: high-temperature operation. Here, we suggest that, despite some preparation difficulties, substitutional nitrogen in silicon (N-Si) represents an interesting candidate for this purpose, being observable by electron paramagnetic resonance (EPR) at room temperature. We report a study of the nature and dynamics of substitutional nitrogen in silicon, the so-called SL5 paramagnetic center, by X-band continuous-wave EPR, complemented by pulsed EPR. Both natural and Si-28 isotopically enriched nitrogen-doped silicon samples have been used, the latter providing an improvement in the accuracy of the spin Hamiltonian parameters.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Electronic energy level of off-center substitutional nitrogen in silicon: determination by electron spin resonance measurements
    Murakami, Kouichi
    Kuribayashi, Hitoshi
    Masuda, Kohzoh
    Japanese Journal of Applied Physics, Part 2: Letters, 1988, 27 (08):
  • [2] NEW LINES IN ELECTRON SPIN RESONANCE SPECTRUM OF SUBSTITUTIONAL NITROGEN DONORS IN DIAMOND
    LOUBSER, JHN
    DUPREEZ, L
    BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (04): : 457 - &
  • [3] ELECTRONIC-ENERGY LEVEL OF OFF-CENTER SUBSTITUTIONAL NITROGEN IN SILICON - DETERMINATION BY ELECTRON-SPIN RESONANCE MEASUREMENTS
    MURAKAMI, K
    KURIBAYASHI, H
    MASUDA, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (08): : L1414 - L1416
  • [4] Electron Spin-Lattice Relaxation of Substitutional Nitrogen in Silicon: The Role of Disorder and Motional Effects
    Belli, Matteo
    Fanciulli, Marco
    NANOMATERIALS, 2024, 14 (01)
  • [5] Deep Levels and Electron Paramagnetic Resonance Parameters of Substitutional Nitrogen in Silicon from First Principles
    Simha, Chloe
    Herrero-Saboya, Gabriela
    Giacomazzi, Luigi
    Martin-Samos, Layla
    Hemeryck, Anne
    Richard, Nicolas
    NANOMATERIALS, 2023, 13 (14)
  • [6] ELECTRON-SPIN RESONANCE OF OXYGEN-NITROGEN COMPLEX IN SILICON
    HARA, A
    FUKUDA, T
    MIYABO, T
    HIRAI, I
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (01): : 142 - 143
  • [7] Electron spin resonance study of nitrogen-doped microcrystalline silicon and amorphous silicon
    Ehara, T
    APPLIED SURFACE SCIENCE, 1997, 113 : 126 - 129
  • [8] ELECTRON SPIN RESONANCE IN DEFORMED SILICON
    Alexander, H.
    Labusch, R.
    Sander, W.
    SOLID STATE COMMUNICATIONS, 1965, 3 (11) : 357 - 360
  • [9] SPIN RESONANCE IN ELECTRON IRRADIATED SILICON
    WATKINS, GD
    CORBETT, JW
    WALKER, RM
    JOURNAL OF APPLIED PHYSICS, 1959, 30 (08) : 1198 - 1203
  • [10] ELECTRON SPIN RESONANCE IN A SILICON SEMICONDUCTOR
    PORTIS, AM
    KIP, AF
    KITTEL, C
    BRATTAIN, WH
    PHYSICAL REVIEW, 1953, 90 (05): : 988 - 989