Thickness-independent electron field emission from tetrahedral amorphous carbon films

被引：20
|
作者：
Zhao, JP [1 ]
Chen, ZY
Wang, X
Shi, TS
Yano, T
机构：
[1] Chinese Acad Sci, Shanghai Inst Met, Ion Beam Lab, Shanghai 200050, Peoples R China
[2] Shikoku Natl Ind Res Inst, Takamatsu, Kagawa 7610395, Japan
来源：
APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 02期
关键词：
D O I：
10.1063/1.125699
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Electron field emission properties of tetrahedral amorphous carbon films of different thicknesses have been studied. The experimental results indicate that there exists no close relationship between threshold electric field and film thickness. Different field emission models are used to examine the experimental results in order to explain the thickness-independent electron field emission properties. (C) 2000 American Institute of Physics. [S0003-6951(00)01102-5].
引用
收藏
页码：191 / 193
页数：3
相关论文
共 50 条
  • [1] Electron field emission from multilayered tetrahedral amorphous carbon films
    Shi, X
    Cheah, LK
    Silva, SRP
    Tay, BK
    Yang, HS
    Sun, Z
    COVALENTLY BONDED DISORDERED THIN-FILM MATERIALS, 1998, 498 : 215 - 220
  • [2] Electron field emission properties of tetrahedral amorphous carbon films
    Cheah, LK
    Shi, X
    Liu, E
    Tay, BK
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (09) : 6816 - 6821
  • [3] Electron field emission from surface treated tetrahedral amorphous carbon films
    Shi, X
    Cheah, LK
    Tay, BK
    Silva, SRP
    APPLIED PHYSICS LETTERS, 1999, 74 (06) : 833 - 835
  • [4] Electron field emission from tetrahedral amorphous carbon films with multilayer structure
    Zhao, JP
    Chen, ZY
    Wang, X
    Shi, TS
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (11) : 8098 - 8102
  • [5] Field electron emission characteristics of nitrogenated tetrahedral amorphous carbon films
    Zhang, XW
    Cheung, WY
    Wong, SP
    THIN SOLID FILMS, 2003, 429 (1-2) : 261 - 266
  • [6] A study of electron field emission as a function of film thickness from amorphous carbon films
    Forrest, RD
    Burden, AP
    Silva, SRP
    Cheah, LK
    Shi, X
    APPLIED PHYSICS LETTERS, 1998, 73 (25) : 3784 - 3786
  • [7] Field emission from tetrahedral amorphous carbon
    Satyanarayana, BS
    Hart, A
    Milne, WI
    Robertson, J
    APPLIED PHYSICS LETTERS, 1997, 71 (10) : 1430 - 1432
  • [8] Field emission from tetrahedral amorphous carbon
    Satyanarayana, BS
    Hart, A
    Milne, WI
    Robertson, J
    DIAMOND AND RELATED MATERIALS, 1998, 7 (2-5) : 656 - 659
  • [9] Electron holography of thin amorphous carbon films: Measurement of the mean inner potential and a thickness-independent phase shift
    Wanner, M
    Bach, D
    Gerthsen, D
    Werner, R
    Tesche, B
    ULTRAMICROSCOPY, 2006, 106 (4-5) : 341 - 345
  • [10] Field emission from tetrahedral amorphous carbon films with various surface morphologies
    Li, YJ
    Lau, SP
    Tay, BK
    Sun, Z
    Shi, JR
    Cheah, LK
    Shi, X
    DIAMOND AND RELATED MATERIALS, 2001, 10 (08) : 1515 - 1522
12345