The defect technique for partially absorbing and reflecting boundaries: Application to the Ornstein-Uhlenbeck process

被引:4
|
作者
Kay, Toby [1 ]
McKetterick, Thomas John [1 ]
Giuggioli, Luca [1 ,2 ]
机构
[1] Univ Bristol, Dept Engn Math, Bristol BS8 1UB, Avon, England
[2] Univ Bristol, Bristol Ctr Complex Sci, Bristol BS8 1UB, Avon, England
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 2022年 / 36卷 / 07N08期
基金
英国生物技术与生命科学研究理事会; 英国工程与自然科学研究理事会;
关键词
Diffusion; Fokker-Planck equation; defect technique; partially absorbing boundary; partially reflecting boundary; Ornstein-Uhlenbeck process; first-passage processes; SENSITIZED FLUORESCENCE; ANALYTIC SOLUTIONS; ENERGY-TRANSFER; RANDOM WALKERS; DIFFUSION; ANNIHILATION; RELAXATION; TRANSPORT; BARRIERS; SYSTEMS;
D O I
10.1142/S0217979222400112
中图分类号
O59 [应用物理学];
学科分类号
摘要
A particle roaming in a potential in the presence of spatial heterogeneities such as traps or physical barriers is a mathematical representation of a vast number of processes across multiple disciplines, ranging from the dynamics of chemical reactions and the movement of foraging animals to the performance of a financial asset. Among the approaches to tackle such problems, a powerful one is the so-called defect technique. Within a continuous space-time formulation, the technique has been successfully used to analyze diffusion problems with partially absorbing boundaries, but has not been employed to study other types of boundaries. Here we exploit the continuity equation to extend the defect technique to when partially reflecting barriers are present. For each boundary type, we apply the defect formalism to the Ornstein-Uhlenbeck process, recovering known analytical results and presenting new ones.
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页数:19
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