Determination of the Dispersion of the Principal Refractive Indices for Birefringent Polypropylene Films

被引：1
|
作者：
Bezruchenko, V. S. [1 ]
Murauski, An. A. [1 ]
Muravsky, Al. A. [1 ]
机构：
[1] Natl Acad Sci Belarus, Inst Chem New Mat, Minsk 220141, BELARUS
来源：
JOURNAL OF APPLIED SPECTROSCOPY | 2014年 / 81卷 / 03期
关键词：
dispersion; anisotropy; interference; circular polarizer; compensating films; phase retarder;
D O I：
10.1007/s10812-014-9957-y
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
We present a novel method for determining the dispersion of the refractive indices of birefringent films, based on treatment of transmission spectra, in which we observe interference of light. The dispersion curves n (x) (lambda) and n (y) (lambda) were determined by treatment of transmission spectra obtained for normal incidence of radiation on a P2-25 birefringent fi lm, and n (z) (lambda) was determined for oblique incidence of radiation. From the results of determination of the dispersions of the principal refractive indices of a birefringent P2-25 polypropylene film (Mogilevkhimvolokno OAO, Belarus), we established that the sample is a negative biaxial retarder with Nz = 2.9.
引用
收藏
页码：476 / 482
页数：7
相关论文
共 50 条
  • [1] Determination of the Dispersion of the Principal Refractive Indices for Birefringent Polypropylene Films
    V. S. Bezruchenko
    An. A. Murauski
    Al. A. Muravsky
    Journal of Applied Spectroscopy, 2014, 81 : 476 - 482
  • [2] The determination of the refractive indices and the direction of the optical axis in birefringent uniaxial prisms
    Simon, MC
    Simon, JM
    Larocca, PA
    SECOND IBEROAMERICAN MEETING ON OPTICS, 1996, 2730 : 224 - 227
  • [3] Dispersion of Principal Refractive Indices of CaGa2S4
    Shim, YongGu
    Kondo, Shinya
    Kataoka, Kouji
    Wakita, Kazuki
    Abdullayeva, Sevda
    Mamedov, Nazim
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (10) : 8178 - 8181
  • [4] Control of the principal refractive indices in biaxial metal oxide films
    Wakefield, Nicholas G.
    Sorge, Jason B.
    Taschuk, Michael T.
    Bezuidenhout, Louis W.
    Brett, Michael J.
    Sit, Jeremy C.
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2011, 28 (09) : 1830 - 1840
  • [5] Measurement of principal refractive indices of birefringent wafer by analysis of Fabry-Perot interference fringes
    Choi, Hee Joo
    Cha, Myoungsik
    APPLIED OPTICS, 2014, 53 (24) : 5527 - 5530
  • [6] Simultaneous determination of thickness and refractive indices of birefringent wafer by simple transmission measurement
    Choi, Hee Joo
    Ryu, Jun Yeol
    Cha, Myoungsik
    INTERFEROMETRY XVII: TECHNIQUES AND ANALYSIS, 2014, 9203
  • [7] COMPARISON OF METHODS FOR DETERMINATION OF REFRACTIVE INDICES OF INTERFERENCE FILMS
    ELLIS, WP
    MULFORD, AD
    ALLEN, LD
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (11) : 1571 - &
  • [8] EFFECTIVE PRINCIPAL REFRACTIVE-INDEXES AND COLUMN ANGLES FOR PERIODIC STACKS OF THIN BIREFRINGENT FILMS
    HODGKINSON, I
    WU, QH
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1993, 10 (09): : 2065 - 2071
  • [9] Algebraic determination of the principal refractive indices and axes in the electro-optic effect
    Department of Physics, University of Natal, Scottsville, 3209 Pietermaritzburg, South Africa
    Appl. Opt., 36 (8438-8447):
  • [10] Algebraic determination of the principal refractive indices and axes in the electro-optic effect
    Gunning, MJ
    Raab, RE
    APPLIED OPTICS, 1998, 37 (36): : 8438 - 8447
12345