Indication of thermal roughening in the retrieved mean inner potential across a I£5 grain boundary in SrTiO3 annealed at different temperatures

被引：4

作者：

Rajak, Piu ^{[1
]}

Lee, Sung Bo ^{[2
,3
]}

Bhattacharyya, Somnath ^{[1
]}

机构：

[1] Indian Inst Technol, Dept Met & Mat Engn, Madras 600036, Tamil Nadu, India

[2] Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 08826, South Korea

[3] Seoul Natl Univ, RIAM, Seoul 08826, South Korea

来源：

JOURNAL OF MATERIALS SCIENCE | 2016年 / 51卷 / 03期

基金：

新加坡国家研究基金会;

关键词：

FRESNEL CONTRAST ANALYSIS; PHASE-TRANSITIONS; INTERFACES; PROFILES; HOLOGRAPHY; CRYSTALS; SILICON; SURFACE;

D O I：

10.1007/s10853-015-9468-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have measured the mean inner potential depth at a I 5 pound grain boundary in a SrTiO3 bicrystal by reconstructing the exit-face wave function from an image focal series collected by transmission electron microscopy. We find that, as the annealing temperature increases, the potential depth at the grain boundary exponentially increases. We interpret the temperature dependence of the potential depth as the signature of a grain-boundary thermal roughening transition.

引用

页码：1484 / 1489

页数：6